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The dark and bright (scan)lines in CRT-Geom for WinUAE are less clearly defined than compared with the Retroarch counterpart. Disabling bilinear filter in WinUAE makes no difference to this picture.
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There are two possible differences between WinUAE and RA implementation here (and their combination). In RA the scanlines are calculated in the exact output resolution while in WinUAE in scaled internal one. The fractional pixel beam values are therefore somewhat different resulting different strength. The next one might be that the scanline parameters differ, with 0.3 as a RA default and 0.4 (0.38) as in WinUAE.
Regarding the mask, the mask in RA is applied in gamma space, mitigating the spikes. In WinUAE, the mask is applied in linear space, looks more spiky and darkens a bit more, but it can look nice also.
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Is the maximum sharpness setting of 4.0 in CRTGeom for WinUAE possibly different from the sharpest sharpness setting in Retroarch (i.e. more filtering in the WinUAE shader)?
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Horizontal sharpness is smarter implemented in WinUAE since you can have an arbitrary value defined (like 1.0, 1.35, 1.5, 1.75...even 10.0). In RA an offset hack is used, only numbers 1.0, 2.0 and 3.0 (no interpolation) are valid.
Vertical sharpness isn't supported in neither versions, it's hard coded since it determines the scanlines itself.